The ATT-A tester is an equipment to test the resistance of the smart card surface elements to abrasion. The card is placed on a bed; the head can receive either 35x35mm sandpaper (CQM test method TM-B04-1) or 13×19 mm soft eraser rub (CQM test method TM-B04-2). Length and position to abrade can be set, head support different weights and speed is adjustable up to 100 mm/s. For sandpaper test, the head is lifted up when it is repositioned to its start position. In the middle of the tester, there is a cutting tool for sandpaper. Applications The ATT-A tester is the perfect equipment to test the resistance of the smart card surface elements to abrasion.
The CWT-A fixture is a gravity-fed ramp with defined gaps for the quick in-production Pass/Fail testing of overall card warpage It comes in two versions: – CWT-A1 with gauge 1.5mm and 1.3mm for un-embossed cards. – CWT-A2 with gauge 2.5mm and 2.3mm for embossed cards.
This tool is designed to test the overall card warpage of the card after personalization for non-embossed cards (1,5mm) and embossed cards (2,5 mm).
It complies with ISO/IEC 7810 & 7811-1 norms.
It can be used for:
- Quality control / Production control.
- Support to CQM certification and audit.
This tool is a combo tool which includes the CWT-A1 and CWT-A2. It allows, thanks to a reversible gauge (1.5mm height and 2.5mm height), to control the warpage of either a card without embossing characters or a card with embossed characters.