CWT-A – Overall Card Warpage Test Tool
The CWT-A fixture is a gravity-fed ramp with defined gaps for the quick in-production Pass/Fail testing of overall card warpage It comes in two versions: – CWT-A1 with gauge 1.5mm and 1.3mm for un-embossed cards. – CWT-A2 with gauge 2.5mm and 2.3mm for embossed cards.
The CWT-A fixture is a gravity-fed ramp with defined gaps for the quick in-production Pass/Fail testing of overall card warpage
It comes in two versions:
– CWT-A1 with gauge 1.5mm and 1.3mm for un-embossed cards.
– CWT-A2 with gauge 2.5mm and 2.3mm for embossed cards.
This tool is designed to test the warpage of the card after personalization. It complies with ISO/IEC 7810 & 7811-1 norms.
– Quality control / Production control
– Support to CQM certification and audit
Easy go/no-go quick control of the overall card warpage with a unique ramp and two pre-defined gaps: 1.5mm and 1.3mm for un-embossed cards, 2.5mm and 2.3mm for embossed cards (select the model with the type of card)
– CWT-A1 for non embossed card
– CWT-A2 for embossed card
Aircraft grade 6061 aluminum /steel alloy bar stock and electro-statically coated for a durable long-lasting finish
|Dimensions||14 x 7 x 21.5 cm|
Card dimension test for return cards : This device is quick and accurate method for GO/NO GO while checking the 2D dimension of an ID-1 card. It comes in two versions: – CDT-A1 for returned cards – CDT-A2 for unused cards.
This tool is a combo tool which includes the CWT-A1 and CWT-A2. It allows, thanks to a reversible gauge (1.5mm height and 2.5mm height), to control the warpage of either a card without embossing characters or a card with embossed characters.
The IBS tool is designed according to CQM to perform backside spot pressure test, it works with the preparation tool on the right side. This version comes with digital gauge connected to a PC and a dedicated utility.
The ATT-A tester is an equipment to test the resistance of the smart card surface elements to abrasion. The card is placed on a bed; the head can receive either 35x35mm sandpaper (CQM test method TM-B04-1) or 13×19 mm soft eraser rub (CQM test method TM-B04-2). Length and position to abrade can be set, head support different weights and speed is adjustable up to 100 mm/s. For sandpaper test, the head is lifted up when it is repositioned to its start position. In the middle of the tester, there is a cutting tool for sandpaper. Applications The ATT-A tester is the perfect equipment to test the resistance of the smart card surface elements to abrasion.