CWT-EB
This tool is designed to test the overall card warpage of the card after personalization for non-embossed cards (1,5mm) and embossed cards (2,5 mm).
It complies with ISO/IEC 7810 & 7811-1 norms.
It can be used for:
- Quality control / Production control.
- Support to CQM certification and audit.
This tool is designed to test the overall card warpage of the card after personalization for non-embossed cards (1,5mm) and embossed cards (2,5 mm).
It complies with ISO/IEC 7810 & 7811-1 norms.
It can be used for:
- Quality control / Production control.
- Support to CQM certification and audit.
Latest Products
IMT-A – Card Impact Test Tool
The IMT-A test tool has been designed according to industry specification for card body impact testing.
CDT-A – Card Dimension Test Tool
Card dimension test for return cards : This device is quick and accurate method for GO/NO GO while checking the 2D dimension of an ID-1 card. It comes in two versions: – CDT-A1 for returned cards – CDT-A2 for unused cards.
CDT-E – Card Dimension Test Tool
This tool equipped with digital gauge (connected or not to a PC) is a quick and accurate method to measure card body width and height according to CQM test requirements.
WTT-D-5-R20_25 Multiple Cards Wrapping Test Tool for Durability
The WTT-D-5-R20_25 is a tool designed to test at the same the resistance to static wrapping stress of 10 IC module embedded into ID1 cards format .
CWT-E – Overall Card Warpage Test Tool
This tool is a combo tool which includes the CWT-A1 and CWT-A2. It allows, thanks to a reversible gauge (1.5mm height and 2.5mm height), to control the warpage of either a card without embossing characters or a card with embossed characters.