This tool is designed to test the overall card warpage of the card after personalization for non-embossed cards (1,5mm) and embossed cards (2,5 mm).
It complies with ISO/IEC 7810 & 7811-1 norms.
It can be used for:
- Quality control / Production control.
- Support to CQM certification and audit.
The ATT-A tester is an equipment to test the resistance of the smart card surface elements to abrasion. The card is placed on a bed; the head can receive either 35x35mm sandpaper (CQM test method TM-B04-1) or 13×19 mm soft eraser rub (CQM test method TM-B04-2). Length and position to abrade can be set, head support different weights and speed is adjustable up to 100 mm/s. For sandpaper test, the head is lifted up when it is repositioned to its start position. In the middle of the tester, there is a cutting tool for sandpaper. Applications The ATT-A tester is the perfect equipment to test the resistance of the smart card surface elements to abrasion.
Card dimension test for return cards : This device is quick and accurate method for GO/NO GO while checking the 2D dimension of an ID-1 card. It comes in two versions: – CDT-A1 for returned cards – CDT-A2 for unused cards.
The WTT-D-5-R20_25 is a tool designed to test at the same the resistance to static wrapping stress of 10 IC module embedded into ID1 cards format .