WTT-D-5-R20_25 Multiple Cards Wrapping Test Tool for Durability
The WTT-D-5-R20_25 is a tool designed to test at the same the resistance to static wrapping stress of 10 IC module embedded into ID1 cards format .
The WTT-D-5-R20_25 is a tool designed to test at the same the resistance to static wrapping stress of 10 IC module embedded into ID1 cards format.
– 5 cards on radius 20mm on one side.
– 5 cards on radius 25mm on the other side.
It complies with the latest CQM specifications (TM-422 test method).
– IC module qualification.
– Smart card Quality control / Production control.
– Flexible test with two radius.
– 20mm radius
– 25mm radius
It can be adapted to stress 10 cards on the same radius on one row or 20 cards on two rows.
Aircraft grade 6061 aluminum / steel alloy with coating for long-lasting finish
|Dimensions||37 x 30 x 21 cm|
The PST test tool is designed according to industry specification for card peel testing. The digital strain gauge installed can be connected to a PC with Go/No-Go assistant Mulann utility for data recording via RS-232 cable supplied with the device. This tester needs to work with the PSPT-A tools. PSPT-A has two versions for one cut or four cuts.
The FTD-A performs simultaneously on 8 cards: bending of 2 cards in the longitudinal axis, 2 cards in the transversal axis and torsion of 2 cards. 2 cards are stressed as shortened bending according to ISO24789-2.
The FTD-P20 is a second tester version dedicated to perform both bending and torsion according to ISO10373-1 on 20 cards. 5 cards are stressed as shortened bending according to ISO24789-2.
Card dimension test for return cards : This device is quick and accurate method for GO/NO GO while checking the 2D dimension of an ID-1 card. It comes in two versions: – CDT-A1 for returned cards – CDT-A2 for unused cards.
The ATT-A tester is an equipment to test the resistance of the smart card surface elements to abrasion. The card is placed on a bed; the head can receive either 35x35mm sandpaper (CQM test method TM-B04-1) or 13×19 mm soft eraser rub (CQM test method TM-B04-2). Length and position to abrade can be set, head support different weights and speed is adjustable up to 100 mm/s. For sandpaper test, the head is lifted up when it is repositioned to its start position. In the middle of the tester, there is a cutting tool for sandpaper. Applications The ATT-A tester is the perfect equipment to test the resistance of the smart card surface elements to abrasion.