WTT-D-5-R20_25 Multiple Cards Wrapping Test Tool for Durability
The WTT-D-5-R20_25 is a tool designed to test at the same the resistance to static wrapping stress of 10 IC module embedded into ID1 cards format .
The WTT-D-5-R20_25 is a tool designed to test at the same the resistance to static wrapping stress of 10 IC module embedded into ID1 cards format.
– 5 cards on radius 20mm on one side.
– 5 cards on radius 25mm on the other side.
It complies with the latest CQM specifications (TM-422 test method).
– IC module qualification.
– Smart card Quality control / Production control.
– Flexible test with two radius.
– 20mm radius
– 25mm radius
It can be adapted to stress 10 cards on the same radius on one row or 20 cards on two rows.
Aircraft grade 6061 aluminum / steel alloy with coating for long-lasting finish
|Dimensions||37 x 30 x 21 cm|
The PST test tool is designed according to industry specification for card peel testing. The digital strain gauge installed can be connected to a PC with Go/No-Go assistant Mulann utility for data recording via RS-232 cable supplied with the device. This tester needs to work with the PSPT-A tools. PSPT-A has two versions for one cut or four cuts.
The ATT-A tester is an equipment to test the resistance of the smart card surface elements to abrasion. The card is placed on a bed; the head can receive either 35x35mm sandpaper (CQM test method TM-B04-1) or 13×19 mm soft eraser rub (CQM test method TM-B04-2). Length and position to abrade can be set, head support different weights and speed is adjustable up to 100 mm/s. For sandpaper test, the head is lifted up when it is repositioned to its start position. In the middle of the tester, there is a cutting tool for sandpaper. Applications The ATT-A tester is the perfect equipment to test the resistance of the smart card surface elements to abrasion.
This tool is a combo tool which includes the CWT-A1 and CWT-A2. It allows, thanks to a reversible gauge (1.5mm height and 2.5mm height), to control the warpage of either a card without embossing characters or a card with embossed characters.
The CWT-A fixture is a gravity-fed ramp with defined gaps for the quick in-production Pass/Fail testing of overall card warpage It comes in two versions: – CWT-A1 with gauge 1.5mm and 1.3mm for un-embossed cards. – CWT-A2 with gauge 2.5mm and 2.3mm for embossed cards.
Card dimension test for return cards : This device is quick and accurate method for GO/NO GO while checking the 2D dimension of an ID-1 card. It comes in two versions: – CDT-A1 for returned cards – CDT-A2 for unused cards.